Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems.
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| Title: | Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems. |
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| Authors: | Fitzgerald DM; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA; Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA., Babakhanova G; Biosystems and Biomaterials Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Stafford CM; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Guag J; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Liu Z; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Hammer DX; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Sochol RD; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA., Agrawal A; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA. |
| Source: | Advanced materials technologies [Adv Mater Technol] 2025 Sep 04; Vol. 10 (17). |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Wiley Blackwell Country of Publication: United States NLM ID: 101717732 Publication Model: Print Cited Medium: Internet ISSN: 2365-709X (Electronic) NLM ISO Abbreviation: Adv Mater Technol Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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