Directly probing the carrier transfer length in 2D-material transistors.

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Title: Directly probing the carrier transfer length in 2D-material transistors.
Authors: Yang ZL; Graduate School of Advanced Technology, National Taiwan University, Taipei, Taiwan.; Department of Physics, National Taiwan University, Taipei, Taiwan.; Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, Taiwan., Huang BC; Department of Physics, National Taiwan University, Taipei, Taiwan.; Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, Taiwan., Lin YK; Department of Physics, National Taiwan University, Taipei, Taiwan., Lin YR; Graduate School of Advanced Technology, National Taiwan University, Taipei, Taiwan., Hsu HC; Department of Physics, National Taiwan University, Taipei, Taiwan., Chen HY; Graduate School of Advanced Technology, National Taiwan University, Taipei, Taiwan., Wan Y; Department of Mechanical Engineering, The University of Hong Kong, Pokfulam, Hong Kong.; Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore., Tseng KW; Graduate School of Advanced Technology, National Taiwan University, Taipei, Taiwan.; Department of Physics, National Taiwan Normal University, Taipei, Taiwan., Yang ST; Department of Physics, National Taiwan Normal University, Taipei, Taiwan., Lo HC; Department of Physics, National Taiwan Normal University, Taipei, Taiwan., Huang YJ; Department of Physics, National Taiwan Normal University, Taipei, Taiwan., Zheng F; Department of Mechanical Engineering, The University of Hong Kong, Pokfulam, Hong Kong., Yang N; Department of Mechanical Engineering, The University of Hong Kong, Pokfulam, Hong Kong.; Nexstrom Pte. Ltd., Singapore, Singapore., Meng W; Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore., Min J; Department of Mechanical Engineering, The University of Hong Kong, Pokfulam, Hong Kong., Huang PC; Department of Physics, National Taiwan University, Taipei, Taiwan., Lan YW; Department of Physics, National Taiwan Normal University, Taipei, Taiwan. ywlan@ntnu.edu.tw.; Institute of Physics, Academia Sinica, Taipei, Taiwan. ywlan@ntnu.edu.tw., Li LJ; Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore. lance.li@nus.edu.sg.; Department of Physics, National Taiwan Normal University, Taipei, Taiwan. lance.li@nus.edu.sg., Chiu YP; Graduate School of Advanced Technology, National Taiwan University, Taipei, Taiwan. ypchiu66@ntu.edu.tw.; Department of Physics, National Taiwan University, Taipei, Taiwan. ypchiu66@ntu.edu.tw.; Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei, Taiwan. ypchiu66@ntu.edu.tw.; Institute of Physics, Academia Sinica, Taipei, Taiwan. ypchiu66@ntu.edu.tw.
Source: Nature [Nature] 2026 Jul; Vol. 655 (8122), pp. 350-356. Date of Electronic Publication: 2026 Jul 01.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 0410462 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1476-4687 (Electronic) Linking ISSN: 00280836 NLM ISO Abbreviation: Nature Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1476-4687
DOI:10.1038/s41586-026-10707-0