| Authors: |
Yuan S; School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, People's Republic of China., Xuan P; Yangtze Memory Technology Co., Ltd. (YMTC), Wuhan, 430078, People's Republic of China., Xu M; Department of Electrical and Electronic Engineering, the University of Hong Kong, Hong Kong, People's Republic of China. mengxu@hku.hk., Xu M; School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, People's Republic of China. mxu@hust.edu.cn., Miao X; School of Integrated Circuits, Huazhong University of Science and Technology, Wuhan, 430074, People's Republic of China. |
