| Authors: |
Sherif S; School of Electronics, Communications and Computer Engineering, Egypt-Japan University of Science and Technology (E-JUST), New Borg El Arab, Egypt. sameh.sherif@aucegypt.edu.; Biomedical Engineering Department, Capital University (Formerly Helwan University), Cairo, Egypt. sameh.sherif@aucegypt.edu.; Center of Nanoelectronics and Devices (CND), Zewail City of Science and Technology, The American University in Cairo (AUC), Giza, Egypt. sameh.sherif@aucegypt.edu., Ghallab YH; Biomedical Engineering Department, Capital University (Formerly Helwan University), Cairo, Egypt.; Center of Nanoelectronics and Devices (CND), Zewail City of Science and Technology, The American University in Cairo (AUC), Giza, Egypt., Ismail Y; Center of Nanoelectronics and Devices (CND), Zewail City of Science and Technology, The American University in Cairo (AUC), Giza, Egypt. |
