Resilient Control Under Side-Channel Compromise for IoMT Devices.

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Bibliographic Details
Title: Resilient Control Under Side-Channel Compromise for IoMT Devices.
Authors: Ohemeng MO; Department of Computer Science, University of Idaho, Moscow, ID 83844, USA., Sheldon FT; Department of Computer Science, University of Idaho, Moscow, ID 83844, USA.
Source: Sensors (Basel, Switzerland) [Sensors (Basel)] 2026 Sep 22; Vol. 26 (19). Date of Electronic Publication: 2026 Sep 22.
Publication Type: Journal Article
Journal Info: Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: MEDLINE
Database: MEDLINE Ultimate
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