CW, K., YI, H., & KL, L. (2026). Deep-learning side-channel analysis of embedded ML-KEM: Single-trace message recovery, cross-device generalization, and frequency-band leakage characterization. PloS one, 21(11), e0358974. https://doi.org/10.1371/journal.pone.0358974
Chicago Style (17th ed.) CitationCW, Kuo, Hung YI, and Lin KL. "Deep-learning Side-channel Analysis of Embedded ML-KEM: Single-trace Message Recovery, Cross-device Generalization, and Frequency-band Leakage Characterization." PloS One 21, no. 11 (2026): e0358974. https://doi.org/10.1371/journal.pone.0358974.
MLA (9th ed.) CitationCW, Kuo, et al. "Deep-learning Side-channel Analysis of Embedded ML-KEM: Single-trace Message Recovery, Cross-device Generalization, and Frequency-band Leakage Characterization." PloS One, vol. 21, no. 11, 2026, p. e0358974, https://doi.org/10.1371/journal.pone.0358974.