Bale, H., Abdelloui, L., Tordoff, B., & Zaefferer, S. (2024). Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 30, 1. https://doi.org/10.1093/mam/ozae044.131
Chicago Style (17th ed.) CitationBale, Hrishikesh, Lamya Abdelloui, Benjamin Tordoff, and Stefan Zaefferer. "Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 30 (2024): 1. https://doi.org/10.1093/mam/ozae044.131.
MLA (9th ed.) CitationBale, Hrishikesh, et al. "Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 30, 2024, p. 1, https://doi.org/10.1093/mam/ozae044.131.