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Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials.

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Title: Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials.
Authors: Bale, Hrishikesh, Abdelloui, Lamya, Tordoff, Benjamin, Zaefferer, Stefan
Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2024 Supplement; Vol. 30.
Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276
Database: MEDLINE Ultimate
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  Data: Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials.
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  Data: <searchLink fieldCode="JN" term="%229712707%22">Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada</searchLink> 2024 Supplement; Vol. 30.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Oxford+University+Press+%2F+USA%22">Oxford University Press / USA </searchLink><i>ISSN: </i>1431-9276
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      – Type: doi
        Value: 10.1093/mam/ozae044.131
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      – Code: eng
        Text: English
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      – TitleFull: Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials.
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            NameFull: Bale, Hrishikesh
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            NameFull: Abdelloui, Lamya
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            NameFull: Tordoff, Benjamin
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              Text: 2024 Supplement
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              Y: 2024
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              Value: 1435-8115
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              Value: 30
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            – TitleFull: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
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