APA (7th ed.) Citation

Own, C., Corbin, G., Dellby, N., Elston, B., Keyse, R., Murfitt, M., . . . Krivanek, O. (2006). High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 12(S02), 1104. https://doi.org/10.1017/S143192760606435X

Chicago Style (17th ed.) Citation

Own, CS, GJ Corbin, N. Dellby, BF Elston, RJ Keyse, MF Murfitt, ZS Szilagyi, and OL Krivanek. "High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 12, no. S02 (2006): 1104. https://doi.org/10.1017/S143192760606435X.

MLA (9th ed.) Citation

Own, CS, et al. "High-stability, Highly Automated Double-eucentric (S)TEM Sample Stage." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 12, no. S02, 2006, p. 1104, https://doi.org/10.1017/S143192760606435X.