Own, C., Dellby, N., Krivanek, O., Marks, L., & Murfitt, M. (2007). Aberration-corrected Precession Electron Diffraction. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 13(S02), 96. https://doi.org/10.1017/S1431927607078555
Chicago Style (17th ed.) CitationOwn, CS, N. Dellby, O. Krivanek, LD Marks, and M. Murfitt. "Aberration-corrected Precession Electron Diffraction." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 13, no. S02 (2007): 96. https://doi.org/10.1017/S1431927607078555.
MLA (9th ed.) CitationOwn, CS, et al. "Aberration-corrected Precession Electron Diffraction." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 13, no. S02, 2007, p. 96, https://doi.org/10.1017/S1431927607078555.