APA (7th ed.) Citation

Bacon, N., Corbin, G., Dellby, N., Hrncirik, P., Krivanek, O., Murfitt, M., . . . Szilagyi, Z. (2009). Aberration-Corrected STEM. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 15(S2), 1462. https://doi.org/10.1017/S1431927609098912

Chicago Style (17th ed.) Citation

Bacon, NJ, GJ Corbin, N. Dellby, P. Hrncirik, O. Krivanek, M. Murfitt, CS Own, and Z. Szilagyi. "Aberration-Corrected STEM." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 15, no. S2 (2009): 1462. https://doi.org/10.1017/S1431927609098912.

MLA (9th ed.) Citation

Bacon, NJ, et al. "Aberration-Corrected STEM." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 15, no. S2, 2009, p. 1462, https://doi.org/10.1017/S1431927609098912.