Betsch, S., & Ebner, B. (2019). A new characterization of the Gamma distribution and associated goodness-of-fit tests. Metrika, 82(7), 779. https://doi.org/10.1007/s00184-019-00708-7
Chicago Style (17th ed.) CitationBetsch, Steffen, and Bruno Ebner. "A New Characterization of the Gamma Distribution and Associated Goodness-of-fit Tests." Metrika 82, no. 7 (2019): 779. https://doi.org/10.1007/s00184-019-00708-7.
MLA (9th ed.) CitationBetsch, Steffen, and Bruno Ebner. "A New Characterization of the Gamma Distribution and Associated Goodness-of-fit Tests." Metrika, vol. 82, no. 7, 2019, p. 779, https://doi.org/10.1007/s00184-019-00708-7.
Warning: These citations may not always be 100% accurate.