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A new characterization of the Gamma distribution and associated goodness-of-fit tests.

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Title: A new characterization of the Gamma distribution and associated goodness-of-fit tests.
Authors: Betsch, Steffen1 (AUTHOR) Steffen.Betsch@student.kit.edu, Ebner, Bruno1 (AUTHOR) Bruno.Ebner@kit.edu
Source: Metrika. Oct2019, Vol. 82 Issue 7, p779-806. 28p.
Database: Mathematics Source
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  Data: A new characterization of the Gamma distribution and associated goodness-of-fit tests.
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  Data: <searchLink fieldCode="AR" term="%22Betsch%2C+Steffen%22">Betsch, Steffen</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> Steffen.Betsch@student.kit.edu</i><br /><searchLink fieldCode="AR" term="%22Ebner%2C+Bruno%22">Ebner, Bruno</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> Bruno.Ebner@kit.edu</i>
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  Data: <searchLink fieldCode="JN" term="%22Metrika%22">Metrika</searchLink>. Oct2019, Vol. 82 Issue 7, p779-806. 28p.
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        Value: 10.1007/s00184-019-00708-7
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              Text: Oct2019
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