APA (7th ed.) Citation

Lee, D., Lee, Y., & Park, B. (2023). Carrier Phase Residual Modeling and Fault Monitoring Using Short-Baseline Double Difference and Machine Learning. Mathematics (2227-7390), 11(12), 2696. https://doi.org/10.3390/math11122696

Chicago Style (17th ed.) Citation

Lee, Dong-Kyeong, Yebin Lee, and Byungwoon Park. "Carrier Phase Residual Modeling and Fault Monitoring Using Short-Baseline Double Difference and Machine Learning." Mathematics (2227-7390) 11, no. 12 (2023): 2696. https://doi.org/10.3390/math11122696.

MLA (9th ed.) Citation

Lee, Dong-Kyeong, et al. "Carrier Phase Residual Modeling and Fault Monitoring Using Short-Baseline Double Difference and Machine Learning." Mathematics (2227-7390), vol. 11, no. 12, 2023, p. 2696, https://doi.org/10.3390/math11122696.