Bayesian inference for reliability of K-out-of-N: G repairable retrial systems with mixed standbys, switching failure and reboot delay.
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| Title: | Bayesian inference for reliability of K-out-of-N: G repairable retrial systems with mixed standbys, switching failure and reboot delay. |
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| Authors: | Luo, Fang1 (AUTHOR), Hu, Linmin1 (AUTHOR) linminhu@ysu.edu.cn, Peng, Rui2 (AUTHOR), Li, Mingjia3 (AUTHOR) |
| Source: | Journal of Statistical Computation & Simulation. Oct2024, Vol. 94 Issue 15, p3457-3488. 32p. |
| Database: | Mathematics Source |
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| ISSN: | 00949655 |
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| DOI: | 10.1080/00949655.2024.2387244 |
