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Bayesian inference for reliability of K-out-of-N: G repairable retrial systems with mixed standbys, switching failure and reboot delay.

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Title: Bayesian inference for reliability of K-out-of-N: G repairable retrial systems with mixed standbys, switching failure and reboot delay.
Authors: Luo, Fang1 (AUTHOR), Hu, Linmin1 (AUTHOR) linminhu@ysu.edu.cn, Peng, Rui2 (AUTHOR), Li, Mingjia3 (AUTHOR)
Source: Journal of Statistical Computation & Simulation. Oct2024, Vol. 94 Issue 15, p3457-3488. 32p.
Database: Mathematics Source
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Statistical+Computation+%26+Simulation%22">Journal of Statistical Computation & Simulation</searchLink>. Oct2024, Vol. 94 Issue 15, p3457-3488. 32p.
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1080/00949655.2024.2387244
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      – Code: eng
        Text: English
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        PageCount: 32
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      – TitleFull: Bayesian inference for reliability of K-out-of-N: G repairable retrial systems with mixed standbys, switching failure and reboot delay.
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            NameFull: Luo, Fang
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            NameFull: Hu, Linmin
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            NameFull: Peng, Rui
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            – D: 01
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              Text: Oct2024
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              Y: 2024
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              Value: 94
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