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Modeling and Simple Parameters Extraction of Calibration Standards for Accurate Mm‐Wave On‐Wafer Measurements up to 110 GHz.

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Title: Modeling and Simple Parameters Extraction of Calibration Standards for Accurate Mm‐Wave On‐Wafer Measurements up to 110 GHz.
Authors: Liu, Kaiyue1 (AUTHOR), Liu, Shuchao2 (AUTHOR), Wang, Zeyu3 (AUTHOR), Si, Liming1 (AUTHOR), Latino, Mariangela4 (AUTHOR), Crupi, Giovanni5 (AUTHOR), Sun, Houjun1 (AUTHOR), Bao, Xiue1,2 (AUTHOR) xiue.bao@bit.edu.cn
Source: International Journal of Numerical Modelling. May/Jun2025, Vol. 38 Issue 3, p1-9. 9p.
Database: Mathematics Source
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DbLabel: Mathematics Source
An: 186112799
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  Data: Modeling and Simple Parameters Extraction of Calibration Standards for Accurate Mm‐Wave On‐Wafer Measurements up to 110 GHz.
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  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Numerical+Modelling%22">International Journal of Numerical Modelling</searchLink>. May/Jun2025, Vol. 38 Issue 3, p1-9. 9p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=msf&AN=186112799
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1002/jnm.70056
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
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        PageCount: 9
        StartPage: 1
    Titles:
      – TitleFull: Modeling and Simple Parameters Extraction of Calibration Standards for Accurate Mm‐Wave On‐Wafer Measurements up to 110 GHz.
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            NameFull: Liu, Kaiyue
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            NameFull: Liu, Shuchao
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            NameFull: Wang, Zeyu
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            NameFull: Si, Liming
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            NameFull: Latino, Mariangela
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            NameFull: Crupi, Giovanni
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            NameFull: Sun, Houjun
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            NameFull: Bao, Xiue
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            – D: 01
              M: 05
              Text: May/Jun2025
              Type: published
              Y: 2025
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              Value: 38
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          Titles:
            – TitleFull: International Journal of Numerical Modelling
              Type: main
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