Selection of optimal software reliability growth models using an integrated entropy–Technique for Order Preference by Similarity to an Ideal Solution (TOPSIS) approach.

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Title: Selection of optimal software reliability growth models using an integrated entropy–Technique for Order Preference by Similarity to an Ideal Solution (TOPSIS) approach.
Authors: Kumar, Vijay1 (AUTHOR), Saxena, Palak1 (AUTHOR), Garg, Harish2 (AUTHOR) harishg58iitr@gmail.com
Source: Mathematical Methods in the Applied Sciences. 3/30/2026, Vol. 49 Issue 5, p3475-3495. 21p.
Database: Mathematics Source
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  Data: Selection of optimal software reliability growth models using an integrated entropy–Technique for Order Preference by Similarity to an Ideal Solution (TOPSIS) approach.
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  Data: <searchLink fieldCode="AR" term="%22Kumar%2C+Vijay%22">Kumar, Vijay</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Saxena%2C+Palak%22">Saxena, Palak</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Garg%2C+Harish%22">Garg, Harish</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> harishg58iitr@gmail.com</i>
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  Data: <searchLink fieldCode="JN" term="%22Mathematical+Methods+in+the+Applied+Sciences%22">Mathematical Methods in the Applied Sciences</searchLink>. 3/30/2026, Vol. 49 Issue 5, p3475-3495. 21p.
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        Value: 10.1002/mma.7445
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        Text: English
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      – TitleFull: Selection of optimal software reliability growth models using an integrated entropy–Technique for Order Preference by Similarity to an Ideal Solution (TOPSIS) approach.
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            NameFull: Kumar, Vijay
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            NameFull: Saxena, Palak
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              Text: 3/30/2026
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