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Characterization of High Tc Materials and Devices by Electron Microscopy

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Title: Characterization of High Tc Materials and Devices by Electron Microscopy
Description: This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
Authors: Nigel D. Browning, Stephen J. Pennycook
Resource Type: eBook.
Subjects: High temperature superconductors, Electron microscopy--Technique
Categories: TECHNOLOGY & ENGINEERING / Superconductors & Superconductivity
Database: eBook Collection (EBSCOhost)
FullText Links:
  – Type: ebook-pdf
Text:
  Availability: 0
Header DbId: nlebk
DbLabel: eBook Collection (EBSCOhost)
An: 112386
RelevancyScore: 966
AccessLevel: 6
PubType: eBook
PubTypeId: ebook
PreciseRelevancyScore: 965.702392578125
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ImageInfo – Size: thumb
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$112386$PDF&s=r
– Size: medium
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$112386$PDF&s=d
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Characterization of High Tc Materials and Devices by Electron Microscopy
– Name: Abstract
  Label: Description
  Group: Ab
  Data: This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Nigel+D%2E+Browning%22">Nigel D. Browning</searchLink><br /><searchLink fieldCode="AR" term="%22Stephen+J%2E+Pennycook%22">Stephen J. Pennycook</searchLink>
– Name: TypePub
  Label: Resource Type
  Group: TypPub
  Data: eBook.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22High+temperature+superconductors%22">High temperature superconductors</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+microscopy--Technique%22">Electron microscopy--Technique</searchLink>
– Name: SubjectBISAC
  Label: Categories
  Group: Su
  Data: <searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Superconductors+%26+Superconductivity%22">TECHNOLOGY & ENGINEERING / Superconductors & Superconductivity</searchLink>
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=nlebk&AN=112386
RecordInfo BibRecord:
  BibEntity:
    Classifications:
      – Code: 537.6230284
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: High temperature superconductors
        Type: general
      – SubjectFull: Electron microscopy--Technique
        Type: general
    Titles:
      – TitleFull: Characterization of High Tc Materials and Devices by Electron Microscopy
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Nigel D. Browning
      – PersonEntity:
          Name:
            NameFull: Stephen J. Pennycook
      – PersonEntity:
          Name:
            NameFull: Nigel D. Browning
      – PersonEntity:
          Name:
            NameFull: Stephen J. Pennycook
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2000
            – D: 04
              M: 02
              Type: profile
              Y: 2014
          Identifiers:
            – Type: isbn-print
              Value: 9780521554909
            – Type: isbn-electronic
              Value: 9780511039669
          Titles:
            – TitleFull: Characterization of High Tc Materials and Devices by Electron Microscopy
              Type: main
ResultId 1