Advanced Mathematical And Computational Tools In Metrology And Testing: Amctm Viii
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| Title: | Advanced Mathematical And Computational Tools In Metrology And Testing: Amctm Viii |
|---|---|
| Description: | The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields.This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons. |
| Authors: | Franco Pavese, Markus Baer, Alistair B Forbes, Jean-marc Linares, Christophe Perruchet, Nien Fan Zhang |
| Resource Type: | eBook. |
| Subjects: | Measurement--Congresses, Physical measurements--Congresses, Metrology--Congresses |
| Categories: | MATHEMATICS / Measurement, MATHEMATICS / Pre-Calculus |
| Database: | eBook Collection (EBSCOhost) |
| FullText | Links: – Type: ebook-pdf Text: Availability: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Advanced Mathematical And Computational Tools In Metrology And Testing: Amctm Viii – Name: Abstract Label: Description Group: Ab Data: The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields.This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple measurands, correlation, etc.), metrology software (e.g. engineering aspects, requirements or specification, risk assessment, software development, software examination, software tools for data analysis, visualization, experiment control, best practice, standards, etc.), numerical methods (e.g. numerical data analysis, numerical simulations, inverse problems, uncertainty evaluation of numerical algorithms, applications, etc.), and data fusion techniques and design and analysis of inter-laboratory comparisons. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Franco+Pavese%22">Franco Pavese</searchLink><br /><searchLink fieldCode="AR" term="%22Markus+Baer%22">Markus Baer</searchLink><br /><searchLink fieldCode="AR" term="%22Alistair+B+Forbes%22">Alistair B Forbes</searchLink><br /><searchLink fieldCode="AR" term="%22Jean-marc+Linares%22">Jean-marc Linares</searchLink><br /><searchLink fieldCode="AR" term="%22Christophe+Perruchet%22">Christophe Perruchet</searchLink><br /><searchLink fieldCode="AR" term="%22Nien+Fan+Zhang%22">Nien Fan Zhang</searchLink> – Name: TypePub Label: Resource Type Group: TypPub Data: eBook. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Measurement--Congresses%22">Measurement--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Physical+measurements--Congresses%22">Physical measurements--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Metrology--Congresses%22">Metrology--Congresses</searchLink> – Name: SubjectBISAC Label: Categories Group: Su Data: <searchLink fieldCode="ZK" term="%22MATHEMATICS+%2F+Measurement%22">MATHEMATICS / Measurement</searchLink><br /><searchLink fieldCode="ZK" term="%22MATHEMATICS+%2F+Pre-Calculus%22">MATHEMATICS / Pre-Calculus</searchLink> |
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| RecordInfo | BibRecord: BibEntity: Classifications: – Code: 530.8 Scheme: ddc Type: prePub Languages: – Code: eng Text: English Subjects: – SubjectFull: Measurement--Congresses Type: general – SubjectFull: Physical measurements--Congresses Type: general – SubjectFull: Metrology--Congresses Type: general Titles: – TitleFull: Advanced Mathematical And Computational Tools In Metrology And Testing: Amctm Viii Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Franco Pavese – PersonEntity: Name: NameFull: Markus Baer – PersonEntity: Name: NameFull: Alistair B Forbes – PersonEntity: Name: NameFull: Jean-marc Linares – PersonEntity: Name: NameFull: Christophe Perruchet – PersonEntity: Name: NameFull: Nien Fan Zhang – PersonEntity: Name: NameFull: Franco Pavese – PersonEntity: Name: NameFull: Markus Baer – PersonEntity: Name: NameFull: Alistair B Forbes – PersonEntity: Name: NameFull: Jean-marc Linares – PersonEntity: Name: NameFull: Christophe Perruchet – PersonEntity: Name: NameFull: Nien Fan Zhang IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Type: published Y: 2009 – D: 01 M: 07 Type: profile Y: 2014 Identifiers: – Type: isbn-print Value: 9789812839510 – Type: isbn-electronic Value: 9789812839527 Numbering: – Type: volume Value: 00078 Titles: – TitleFull: Advanced Mathematical And Computational Tools In Metrology And Testing: Amctm Viii Type: main |
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