ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas

Saved in:
Bibliographic Details
Title: ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
Description: This volume presents the latest information from international specialists in the testing and failure analysis of microelectronic devices. The papers included discuss new aspects of the procedures used to assure the quality of these devices that form the heart of modern control and communication equipment as well as the established practices used in this important field.
Authors: ASM International
Resource Type: eBook.
Subjects: Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated
Database: eBook Collection (EBSCOhost)
FullText Links:
  – Type: ebook-pdf
Text:
  Availability: 0
Header DbId: nlebk
DbLabel: eBook Collection (EBSCOhost)
An: 395824
RelevancyScore: 959
AccessLevel: 6
PubType: eBook
PubTypeId: ebook
PreciseRelevancyScore: 959.155151367188
IllustrationInfo
ImageInfo – Size: thumb
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$395824$PDF&s=r
– Size: medium
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$395824$PDF&s=d
Items – Name: Title
  Label: Title
  Group: Ti
  Data: ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
– Name: Abstract
  Label: Description
  Group: Ab
  Data: This volume presents the latest information from international specialists in the testing and failure analysis of microelectronic devices. The papers included discuss new aspects of the procedures used to assure the quality of these devices that form the heart of modern control and communication equipment as well as the established practices used in this important field.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22ASM+International%22">ASM International</searchLink>
– Name: TypePub
  Label: Resource Type
  Group: TypPub
  Data: eBook.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Electronics--Materials--Testing--Congresses%22">Electronics--Materials--Testing--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+apparatus+and+appliances--Testing--Congresses%22">Electronic apparatus and appliances--Testing--Congresses</searchLink>
– Name: SubjectBISAC
  Label: Categories
  Group: Su
  Data: <searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Electronics+%2F+Circuits+%2F+General%22">TECHNOLOGY & ENGINEERING / Electronics / Circuits / General</searchLink><br /><searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Electronics+%2F+Circuits+%2F+Integrated%22">TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated</searchLink>
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=nlebk&AN=395824
RecordInfo BibRecord:
  BibEntity:
    Classifications:
      – Code: 621.381548
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Electronics--Materials--Testing--Congresses
        Type: general
      – SubjectFull: Electronic apparatus and appliances--Testing--Congresses
        Type: general
    Titles:
      – TitleFull: ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: ASM International
      – PersonEntity:
          Name:
            NameFull: ASM International
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 1998
            – D: 04
              M: 02
              Type: profile
              Y: 2014
          Identifiers:
            – Type: isbn-print
              Value: 9780871706690
            – Type: isbn-electronic
              Value: 9781615030767
          Titles:
            – TitleFull: ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis: 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas
              Type: main
ResultId 1