International, A., & Society, E. D. F. A. (2003). ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California.
Chicago Style (17th ed.) CitationInternational, ASM, and Electronic Device Failure Analysis Society. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. 2003.
MLA (9th ed.) CitationInternational, ASM, and Electronic Device Failure Analysis Society. ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California. 2003.
Warning: These citations may not always be 100% accurate.
