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ISTFA 2003 : Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California

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Title: ISTFA 2003 : Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
Description: This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat® PDF format.
Authors: ASM International, Electronic Device Failure Analysis Society
Resource Type: eBook.
Subjects: Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Electronics / Digital, TECHNOLOGY & ENGINEERING / Electronics / Microelectronics
Database: eBook Collection (EBSCOhost)
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  Data: ISTFA 2003 : Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
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  Data: This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat® PDF format.
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        Type: prePub
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      – Code: eng
        Text: English
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      – SubjectFull: Electronics--Materials--Testing--Congresses
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      – SubjectFull: Electronic apparatus and appliances--Testing--Congresses
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      – TitleFull: ISTFA 2003 : Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
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            – D: 01
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              Type: published
              Y: 2003
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