ISTFA 2003 : Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California
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| Title: | ISTFA 2003 : Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California |
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| Description: | This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat® PDF format. |
| Authors: | ASM International, Electronic Device Failure Analysis Society |
| Resource Type: | eBook. |
| Subjects: | Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses |
| Categories: | TECHNOLOGY & ENGINEERING / Electronics / Digital, TECHNOLOGY & ENGINEERING / Electronics / Microelectronics |
| Database: | eBook Collection (EBSCOhost) |
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