View in EDS PDF Full Text

ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA

Saved in:
Bibliographic Details
Title: ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
Description: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Authors: ASM International, Electronic Device Failure Analysis Society
Resource Type: eBook.
Subjects: Materials--Testing--Congresses, Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated
Database: eBook Collection (EBSCOhost)
FullText Links:
  – Type: ebook-pdf
Text:
  Availability: 0
Header DbId: nlebk
DbLabel: eBook Collection (EBSCOhost)
An: 395897
RelevancyScore: 1005
AccessLevel: 6
PubType: eBook
PubTypeId: ebook
PreciseRelevancyScore: 1004.98577880859
IllustrationInfo
ImageInfo – Size: thumb
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$395897$PDF&s=r
– Size: medium
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$395897$PDF&s=d
Items – Name: Title
  Label: Title
  Group: Ti
  Data: ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
– Name: Abstract
  Label: Description
  Group: Ab
  Data: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22ASM+International%22">ASM International</searchLink><br /><searchLink fieldCode="AR" term="%22Electronic+Device+Failure+Analysis+Society%22">Electronic Device Failure Analysis Society</searchLink>
– Name: TypePub
  Label: Resource Type
  Group: TypPub
  Data: eBook.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Materials--Testing--Congresses%22">Materials--Testing--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Electronics--Materials--Testing--Congresses%22">Electronics--Materials--Testing--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+apparatus+and+appliances--Testing--Congresses%22">Electronic apparatus and appliances--Testing--Congresses</searchLink>
– Name: SubjectBISAC
  Label: Categories
  Group: Su
  Data: <searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Electronics+%2F+Circuits+%2F+General%22">TECHNOLOGY & ENGINEERING / Electronics / Circuits / General</searchLink><br /><searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Electronics+%2F+Circuits+%2F+Integrated%22">TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated</searchLink>
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=nlebk&AN=395897
RecordInfo BibRecord:
  BibEntity:
    Classifications:
      – Code: 621.381548
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Materials--Testing--Congresses
        Type: general
      – SubjectFull: Electronics--Materials--Testing--Congresses
        Type: general
      – SubjectFull: Electronic apparatus and appliances--Testing--Congresses
        Type: general
    Titles:
      – TitleFull: ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: ASM International
      – PersonEntity:
          Name:
            NameFull: Electronic Device Failure Analysis Society
      – PersonEntity:
          Name:
            NameFull: ASM International
      – PersonEntity:
          Name:
            NameFull: Electronic Device Failure Analysis Society
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2006
            – D: 04
              M: 02
              Type: profile
              Y: 2014
          Identifiers:
            – Type: isbn-print
              Value: 9780871708441
            – Type: isbn-electronic
              Value: 9781615030897
          Titles:
            – TitleFull: ISTFA 2006 : Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA
              Type: main
ResultId 1