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ISTFA 2010 : Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA

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Title: ISTFA 2010 : Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA
Description: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Authors: ASM International, Electronic Device Failure Analysis Society
Resource Type: eBook.
Subjects: Electronic apparatus and appliances--Testing--Congresses, Electronics--Materials--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Mechanical
Database: eBook Collection (EBSCOhost)
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  Data: ISTFA 2010 : Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA
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  Data: This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
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  Data: <searchLink fieldCode="AR" term="%22ASM+International%22">ASM International</searchLink><br /><searchLink fieldCode="AR" term="%22Electronic+Device+Failure+Analysis+Society%22">Electronic Device Failure Analysis Society</searchLink>
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        Text: English
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      – SubjectFull: Electronic apparatus and appliances--Testing--Congresses
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      – SubjectFull: Electronics--Materials--Testing--Congresses
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      – TitleFull: ISTFA 2010 : Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA
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            – D: 01
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              Type: published
              Y: 2010
            – D: 10
              M: 07
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