Gettering and Defect Engineering in Semiconductor Technology XIV

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Bibliographic Details
Title: Gettering and Defect Engineering in Semiconductor Technology XIV
Description: GADEST 2011Selected, peer reviewed papers from the XIVth International Biannual Meeting on Gettering and Defect Engineering in Semiconductor (GADEST 2011), September 25-30, 2011, Loipersdorf, Austria
Authors: W. Jantsch, Friedrich Schäffler
Resource Type: eBook.
Subjects: Electrical engineering--Materials--Congresses, Semiconductors--Congresses, Getters--Congresses, Silicon crystals--Defects--Congresses
Categories: TECHNOLOGY & ENGINEERING / Materials Science / General
Database: eBook Collection (EBSCOhost)
Description
Abstract:GADEST 2011Selected, peer reviewed papers from the XIVth International Biannual Meeting on Gettering and Defect Engineering in Semiconductor (GADEST 2011), September 25-30, 2011, Loipersdorf, Austria
ISBN:9783037852323
9783038135159