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Trawling for complements.

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Bibliographic Details
Title: Trawling for complements.
Authors: GREGG, J. MARTY, KUMAR, AMIT
Source: Nature. 6/26/2014, Vol. 510 Issue 7506, p481-482. 2p. 1 Diagram.
Subjects: Electric charge, Charge measurement, Ferroelectric materials, Piezoresponse force microscopy technique, Atomic force microscopes
Abstract: The article offers information related to a research which demonstrates an analogous imaging technique to determine nanoscale charge variations on the surfaces of inorganic materials as of June 2014. Topics discussed include adaptations to an atomic force microscope (AFM) in the study, domain imaging in ferroelectric materials and piezoresponse force microscopy in materials.
Database: Psychology and Behavioral Sciences Collection
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  Data: <searchLink fieldCode="JN" term="%22Nature%22">Nature</searchLink>. 6/26/2014, Vol. 510 Issue 7506, p481-482. 2p. 1 Diagram.
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  Data: <searchLink fieldCode="DE" term="%22Electric+charge%22">Electric charge</searchLink><br /><searchLink fieldCode="DE" term="%22Charge+measurement%22">Charge measurement</searchLink><br /><searchLink fieldCode="DE" term="%22Ferroelectric+materials%22">Ferroelectric materials</searchLink><br /><searchLink fieldCode="DE" term="%22Piezoresponse+force+microscopy+technique%22">Piezoresponse force microscopy technique</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopes%22">Atomic force microscopes</searchLink>
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  Data: The article offers information related to a research which demonstrates an analogous imaging technique to determine nanoscale charge variations on the surfaces of inorganic materials as of June 2014. Topics discussed include adaptations to an atomic force microscope (AFM) in the study, domain imaging in ferroelectric materials and piezoresponse force microscopy in materials.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=pbh&AN=96871526
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      – SubjectFull: Charge measurement
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      – SubjectFull: Ferroelectric materials
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      – SubjectFull: Piezoresponse force microscopy technique
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              Text: 6/26/2014
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