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Health Risk Assessment of Photoresists Used in an Optoelectronic Semiconductor Factory.

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Title: Health Risk Assessment of Photoresists Used in an Optoelectronic Semiconductor Factory.
Authors: Huang, Shao‐Zu1 (AUTHOR), Wu, Kuen‐Yuh1 (AUTHOR) kuenyuhwu@ntu.edu.tw
Source: Risk Analysis: An International Journal. Dec2019, Vol. 39 Issue 12, p2625-2639.
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Header DbId: s3h
DbLabel: SPORTDiscus with Full Text
An: 140088812
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Health Risk Assessment of Photoresists Used in an Optoelectronic Semiconductor Factory.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Huang%2C+Shao‐Zu%22">Huang, Shao‐Zu</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wu%2C+Kuen‐Yuh%22">Wu, Kuen‐Yuh</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> kuenyuhwu@ntu.edu.tw</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Risk+Analysis%3A+An+International+Journal%22">Risk Analysis: An International Journal</searchLink>. Dec2019, Vol. 39 Issue 12, p2625-2639.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=s3h&AN=140088812
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1111/risa.13366
    Languages:
      – Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 15
        StartPage: 2625
    Titles:
      – TitleFull: Health Risk Assessment of Photoresists Used in an Optoelectronic Semiconductor Factory.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Huang, Shao‐Zu
      – PersonEntity:
          Name:
            NameFull: Wu, Kuen‐Yuh
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 12
              Text: Dec2019
              Type: published
              Y: 2019
          Identifiers:
            – Type: issn-print
              Value: 02724332
          Numbering:
            – Type: volume
              Value: 39
            – Type: issue
              Value: 12
          Titles:
            – TitleFull: Risk Analysis: An International Journal
              Type: main
ResultId 1