Which process metrics can significantly improve defect prediction models? An empirical study.

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Bibliographic Details
Title:	Which process metrics can significantly improve defect prediction models? An empirical study.
Authors:	Madeyski, Lech¹, Lech.Madeyski@pwr.edu.pl, Jureczko, Marian¹, Marian.Jureczko@pwr.edu.pl
Source:	Software Quality Journal; Sep2015, Vol. 23 Issue 3, p393-422, 30p
Database:	Applied Science & Technology Source

Description
ISSN:	09639314
DOI:	10.1007/s11219-014-9241-7