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Which process metrics can significantly improve defect prediction models? An empirical study.

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Title: Which process metrics can significantly improve defect prediction models? An empirical study.
Authors: Madeyski, Lech1, Lech.Madeyski@pwr.edu.pl, Jureczko, Marian1, Marian.Jureczko@pwr.edu.pl
Source: Software Quality Journal; Sep2015, Vol. 23 Issue 3, p393-422, 30p
Database: Applied Science & Technology Source
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