Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta2O5 thin films.
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| Title: | Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta2O5 thin films. |
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| Authors: | HAQUE, S. MAIDUL1, SAGDEO, PANKAJ R.2, SHINDE, D. D.1, MISAL, J. S.1, JHA, S. N.3, BHATTACHARYYA, D.3, dibyendu@barc.gov.in, SAHOO, N. K.3 |
| Source: | Applied Optics (1559-128X); 8/1/2015, Vol. 54 Issue 22, p6744-6751, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 1559128X |
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| DOI: | 10.1364/AO.54.006744 |
