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Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta2O5 thin films.

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Title: Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta2O5 thin films.
Authors: HAQUE, S. MAIDUL1, SAGDEO, PANKAJ R.2, SHINDE, D. D.1, MISAL, J. S.1, JHA, S. N.3, BHATTACHARYYA, D.3, dibyendu@barc.gov.in, SAHOO, N. K.3
Source: Applied Optics (1559-128X); 8/1/2015, Vol. 54 Issue 22, p6744-6751, 8p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 108716306
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta2O5 thin films.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22HAQUE%2C+S%2E+MAIDUL%22">HAQUE, S. MAIDUL</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22SAGDEO%2C+PANKAJ+R%2E%22">SAGDEO, PANKAJ R.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22SHINDE%2C+D%2E+D%2E%22">SHINDE, D. D.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22MISAL%2C+J%2E+S%2E%22">MISAL, J. S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22JHA%2C+S%2E+N%2E%22">JHA, S. N.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22BHATTACHARYYA%2C+D%2E%22">BHATTACHARYYA, D.</searchLink><relatesTo>3</relatesTo>, <i>dibyendu@barc.gov.in</i><br /><searchLink fieldCode="AU" term="%22SAHOO%2C+N%2E+K%2E%22">SAHOO, N. K.</searchLink><relatesTo>3</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Optics+%281559-128X%29%22">Applied Optics (1559-128X)</searchLink>; 8/1/2015, Vol. 54 Issue 22, p6744-6751, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=108716306
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1364/AO.54.006744
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 6744
    Titles:
      – TitleFull: Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta2O5 thin films.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: HAQUE, S. MAIDUL
      – PersonEntity:
          Name:
            NameFull: SAGDEO, PANKAJ R.
      – PersonEntity:
          Name:
            NameFull: SHINDE, D. D.
      – PersonEntity:
          Name:
            NameFull: MISAL, J. S.
      – PersonEntity:
          Name:
            NameFull: JHA, S. N.
      – PersonEntity:
          Name:
            NameFull: BHATTACHARYYA, D.
      – PersonEntity:
          Name:
            NameFull: SAHOO, N. K.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 08
              Text: 8/1/2015
              Type: published
              Y: 2015
          Identifiers:
            – Type: issn-print
              Value: 1559128X
          Numbering:
            – Type: volume
              Value: 54
            – Type: issue
              Value: 22
          Titles:
            – TitleFull: Applied Optics (1559-128X)
              Type: main
ResultId 1