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Improved Electrical Characteristics of Ge pMOSFETs With ZrO2/HfO2 Stack Gate Dielectric.

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Title: Improved Electrical Characteristics of Ge pMOSFETs With ZrO2/HfO2 Stack Gate Dielectric.
Authors: Li, Chen-Chien1, Chang-Liao, Kuei-Shu1, Chi, Wei-Fong1, Li, Mong-Chi1, Chen, Ting-Chun1, Su, Tzu-Hsiang1, Chang, Yu-Wei1, Tsai, Chia-Chi1, Liu, Li-Jung1, Fu, Chung-Hao1, Lu, Chun-Chang1
Source: IEEE Electron Device Letters; Jan2016, Vol. 37 Issue 1, p12-15, 4p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 111983224
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Improved Electrical Characteristics of Ge pMOSFETs With ZrO2/HfO2 Stack Gate Dielectric.
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  Data: <searchLink fieldCode="AU" term="%22Li%2C+Chen-Chien%22">Li, Chen-Chien</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chang-Liao%2C+Kuei-Shu%22">Chang-Liao, Kuei-Shu</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chi%2C+Wei-Fong%22">Chi, Wei-Fong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Mong-Chi%22">Li, Mong-Chi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chen%2C+Ting-Chun%22">Chen, Ting-Chun</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Su%2C+Tzu-Hsiang%22">Su, Tzu-Hsiang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Chang%2C+Yu-Wei%22">Chang, Yu-Wei</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tsai%2C+Chia-Chi%22">Tsai, Chia-Chi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Li-Jung%22">Liu, Li-Jung</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Fu%2C+Chung-Hao%22">Fu, Chung-Hao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lu%2C+Chun-Chang%22">Lu, Chun-Chang</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Electron+Device+Letters%22">IEEE Electron Device Letters</searchLink>; Jan2016, Vol. 37 Issue 1, p12-15, 4p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=111983224
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        Value: 10.1109/LED.2015.2497348
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              Text: Jan2016
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