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Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using SiGe Polycrystalline Alloys.

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Bibliographic Details
Title: Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using SiGe Polycrystalline Alloys.
Authors: Vasilevskiy, D., dvasilevskiy@polymtl.ca, Simard, J.-M.1, Caillat, T.2, Masut, R.3, Turenne, S.3
Source: Journal of Electronic Materials; Mar2016, Vol. 45 Issue 3, p1540-1547, 8p
Database: Applied Science & Technology Source
Description
ISSN:03615235
DOI:10.1007/s11664-015-4101-1