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Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using SiGe Polycrystalline Alloys.

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Title: Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using SiGe Polycrystalline Alloys.
Authors: Vasilevskiy, D., dvasilevskiy@polymtl.ca, Simard, J.-M.1, Caillat, T.2, Masut, R.3, Turenne, S.3
Source: Journal of Electronic Materials; Mar2016, Vol. 45 Issue 3, p1540-1547, 8p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using SiGe Polycrystalline Alloys.
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  Data: <searchLink fieldCode="AU" term="%22Vasilevskiy%2C+D%2E%22">Vasilevskiy, D.</searchLink>, <i>dvasilevskiy@polymtl.ca</i><br /><searchLink fieldCode="AU" term="%22Simard%2C+J%2E-M%2E%22">Simard, J.-M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Caillat%2C+T%2E%22">Caillat, T.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Masut%2C+R%2E%22">Masut, R.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Turenne%2C+S%2E%22">Turenne, S.</searchLink><relatesTo>3</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Mar2016, Vol. 45 Issue 3, p1540-1547, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=113221373
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        Value: 10.1007/s11664-015-4101-1
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        Text: English
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      – TitleFull: Consistency of ZT-Scanner for Thermoelectric Measurements from 300 K to 700 K: A Comparative Analysis Using SiGe Polycrystalline Alloys.
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              Text: Mar2016
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