Quantitative Nanometer-Scale Mapping of Dielectric Tunability.

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Bibliographic Details
Title: Quantitative Nanometer-Scale Mapping of Dielectric Tunability.
Authors: Tselev, Alexander1, Klein, Andreas2, Gassmann, Jürgen2, Jesse, Stephen1, Li, Qian1, Kalinin, Sergei V.1, Balke, Nina1
Source: Advanced Materials Interfaces; Oct2015, Vol. 2 Issue 15, pn/a-n/a, 10p
Database: Applied Science & Technology Source
Description
ISSN:21967350
DOI:10.1002/admi.201500088