APA (7th ed.) Citation

Tselev, A., Klein, A., Gassmann, J., Jesse, S., Li, Q., Kalinin, S. V., & Balke, N. (2015). Quantitative Nanometer-Scale Mapping of Dielectric Tunability. Advanced Materials Interfaces, 2(15), n/a. https://doi.org/10.1002/admi.201500088

Chicago Style (17th ed.) Citation

Tselev, Alexander, Andreas Klein, Jürgen Gassmann, Stephen Jesse, Qian Li, Sergei V. Kalinin, and Nina Balke. "Quantitative Nanometer-Scale Mapping of Dielectric Tunability." Advanced Materials Interfaces 2, no. 15 (2015): n/a. https://doi.org/10.1002/admi.201500088.

MLA (9th ed.) Citation

Tselev, Alexander, et al. "Quantitative Nanometer-Scale Mapping of Dielectric Tunability." Advanced Materials Interfaces, vol. 2, no. 15, 2015, p. n/a, https://doi.org/10.1002/admi.201500088.