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Quantitative Nanometer-Scale Mapping of Dielectric Tunability.

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Title: Quantitative Nanometer-Scale Mapping of Dielectric Tunability.
Authors: Tselev, Alexander1, Klein, Andreas2, Gassmann, Jürgen2, Jesse, Stephen1, Li, Qian1, Kalinin, Sergei V.1, Balke, Nina1
Source: Advanced Materials Interfaces; Oct2015, Vol. 2 Issue 15, pn/a-n/a, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 115275177
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Materials+Interfaces%22">Advanced Materials Interfaces</searchLink>; Oct2015, Vol. 2 Issue 15, pn/a-n/a, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=115275177
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        Value: 10.1002/admi.201500088
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        Text: English
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      – TitleFull: Quantitative Nanometer-Scale Mapping of Dielectric Tunability.
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              M: 10
              Text: Oct2015
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              Y: 2015
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