Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds.
Saved in:
| Title: | Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds. |
|---|---|
| Authors: | Chiker, Fafa1, Boukabrine, Fatiha1, Khachai, H.1, h_khachai@yahoo.fr, Khenata, R.2, khenata_rabah@yahoo.fr, Mathieu, C.3, Bin Omran, S.4, Syrotyuk, S.5, Ahmed, W.6, Murtaza, G.7 |
| Source: | Journal of Electronic Materials; Nov2016, Vol. 45 Issue 11, p5811-5821, 11p |
| Database: | Applied Science & Technology Source |
| ISSN: | 03615235 |
|---|---|
| DOI: | 10.1007/s11664-016-4767-z |
