Chiker, F., Boukabrine, F., Khachai, H., Khenata, R., Mathieu, C., Bin Omran, S., . . . Murtaza, G. (2016). Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds. Journal of Electronic Materials, 45(11), 5811. https://doi.org/10.1007/s11664-016-4767-z
Chicago Style (17th ed.) CitationChiker, Fafa, Fatiha Boukabrine, H. Khachai, R. Khenata, C. Mathieu, S. Bin Omran, S. Syrotyuk, W. Ahmed, and G. Murtaza. "Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds." Journal of Electronic Materials 45, no. 11 (2016): 5811. https://doi.org/10.1007/s11664-016-4767-z.
MLA (9th ed.) CitationChiker, Fafa, et al. "Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds." Journal of Electronic Materials, vol. 45, no. 11, 2016, p. 5811, https://doi.org/10.1007/s11664-016-4767-z.