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Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds.

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Title: Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds.
Authors: Chiker, Fafa1, Boukabrine, Fatiha1, Khachai, H.1, h_khachai@yahoo.fr, Khenata, R.2, khenata_rabah@yahoo.fr, Mathieu, C.3, Bin Omran, S.4, Syrotyuk, S.5, Ahmed, W.6, Murtaza, G.7
Source: Journal of Electronic Materials; Nov2016, Vol. 45 Issue 11, p5811-5821, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 118371952
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PubType: Academic Journal
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  Data: Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Nov2016, Vol. 45 Issue 11, p5811-5821, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=118371952
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        Value: 10.1007/s11664-016-4767-z
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        Text: English
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        PageCount: 11
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      – TitleFull: Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO, ZrGeO and HfSiO Compounds.
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              Text: Nov2016
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