Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method.

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Bibliographic Details
Title: Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method.
Authors: Fodor, B.1,2, fodor@mfa.kfki.hu, Kozma, P.1, Burger, S.3, Fried, M.1,4, Petrik, P.1,4
Source: Thin Solid Films; Oct2016 Part A, Vol. 617, p20-24, 5p
Database: Applied Science & Technology Source
Description
ISSN:00406090
DOI:10.1016/j.tsf.2016.01.054