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Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae.

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Title: Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae.
Authors: Zalesak, J.1,2, Todt, J.2, Pitonak, R.3, Köpf, A.3, Weißenbacher, R.3, Sartory, B.4, Burghammer, M.5, Daniel, R.1, Keckes, J.2
Source: Journal of Applied Crystallography; Dec2016, Vol. 49 Issue 6, p2217-2225, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 120011418
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae.
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=120011418
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      – Type: doi
        Value: 10.1107/S1600576716017258
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 2217
    Titles:
      – TitleFull: Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae.
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            NameFull: Zalesak, J.
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            NameFull: Weißenbacher, R.
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            NameFull: Sartory, B.
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            NameFull: Burghammer, M.
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            – D: 01
              M: 12
              Text: Dec2016
              Type: published
              Y: 2016
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              Value: 00218898
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              Value: 49
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              Value: 6
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            – TitleFull: Journal of Applied Crystallography
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