RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.

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Bibliographic Details
Title:	RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.
Authors:	Han, Bin, Wang, Zesong¹, Devi, Neena², Kondamareddy, K.¹, Wang, Zhenguo², Li, Na¹, Zuo, Wenbin², Fu, Dejun¹, djfu@whu.edu.cn, Liu, Chuansheng², csliuan@whu.edu.cn
Source:	Nanoscale Research Letters; 3/1/2017, Vol. 12 Issue 1, p1-8, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	19317573
DOI:	10.1186/s11671-017-1921-3