RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.
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| Title: | RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers. |
|---|---|
| Authors: | Han, Bin, Wang, Zesong1, Devi, Neena2, Kondamareddy, K.1, Wang, Zhenguo2, Li, Na1, Zuo, Wenbin2, Fu, Dejun1, djfu@whu.edu.cn, Liu, Chuansheng2, csliuan@whu.edu.cn |
| Source: | Nanoscale Research Letters; 3/1/2017, Vol. 12 Issue 1, p1-8, 8p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 121497320 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Han%2C+Bin%22">Han, Bin</searchLink><br /><searchLink fieldCode="AU" term="%22Wang%2C+Zesong%22">Wang, Zesong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Devi%2C+Neena%22">Devi, Neena</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kondamareddy%2C+K%2E%22">Kondamareddy, K.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Zhenguo%22">Wang, Zhenguo</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Na%22">Li, Na</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zuo%2C+Wenbin%22">Zuo, Wenbin</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Fu%2C+Dejun%22">Fu, Dejun</searchLink><relatesTo>1</relatesTo>, <i>djfu@whu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Liu%2C+Chuansheng%22">Liu, Chuansheng</searchLink><relatesTo>2</relatesTo>, <i>csliuan@whu.edu.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Nanoscale+Research+Letters%22">Nanoscale Research Letters</searchLink>; 3/1/2017, Vol. 12 Issue 1, p1-8, 8p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=121497320 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1186/s11671-017-1921-3 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 1 Titles: – TitleFull: RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Han, Bin – PersonEntity: Name: NameFull: Wang, Zesong – PersonEntity: Name: NameFull: Devi, Neena – PersonEntity: Name: NameFull: Kondamareddy, K. – PersonEntity: Name: NameFull: Wang, Zhenguo – PersonEntity: Name: NameFull: Li, Na – PersonEntity: Name: NameFull: Zuo, Wenbin – PersonEntity: Name: NameFull: Fu, Dejun – PersonEntity: Name: NameFull: Liu, Chuansheng IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: 3/1/2017 Type: published Y: 2017 Identifiers: – Type: issn-print Value: 19317573 Numbering: – Type: volume Value: 12 – Type: issue Value: 1 Titles: – TitleFull: Nanoscale Research Letters Type: main |
| ResultId | 1 |