RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.

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Title: RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.
Authors: Han, Bin, Wang, Zesong1, Devi, Neena2, Kondamareddy, K.1, Wang, Zhenguo2, Li, Na1, Zuo, Wenbin2, Fu, Dejun1, djfu@whu.edu.cn, Liu, Chuansheng2, csliuan@whu.edu.cn
Source: Nanoscale Research Letters; 3/1/2017, Vol. 12 Issue 1, p1-8, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 121497320
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  Data: RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.
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  Data: <searchLink fieldCode="AU" term="%22Han%2C+Bin%22">Han, Bin</searchLink><br /><searchLink fieldCode="AU" term="%22Wang%2C+Zesong%22">Wang, Zesong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Devi%2C+Neena%22">Devi, Neena</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kondamareddy%2C+K%2E%22">Kondamareddy, K.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Zhenguo%22">Wang, Zhenguo</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Na%22">Li, Na</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zuo%2C+Wenbin%22">Zuo, Wenbin</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Fu%2C+Dejun%22">Fu, Dejun</searchLink><relatesTo>1</relatesTo>, <i>djfu@whu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Liu%2C+Chuansheng%22">Liu, Chuansheng</searchLink><relatesTo>2</relatesTo>, <i>csliuan@whu.edu.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Nanoscale+Research+Letters%22">Nanoscale Research Letters</searchLink>; 3/1/2017, Vol. 12 Issue 1, p1-8, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=121497320
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      – Type: doi
        Value: 10.1186/s11671-017-1921-3
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      – Code: eng
        Text: English
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      – TitleFull: RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.
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              Text: 3/1/2017
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              Y: 2017
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