View in EDS

Transmission measurements of multilayer interference filters developed for a full integration on Complementary Metal Oxide Semiconductor chips.

Saved in:
Bibliographic Details
Title: Transmission measurements of multilayer interference filters developed for a full integration on Complementary Metal Oxide Semiconductor chips.
Authors: Masarotto, L.1, lilian.masarotto@cea.fr, Frey, L.1, Charles, M.L.1, Roule, A.1, Rodriguez, G.1, Souil, R.1, Morales, C.1, Larrey, V.1
Source: Thin Solid Films; Jun2017, Vol. 631, p23-28, 6p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first