A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit.
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| Title: | A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit. |
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| Authors: | Zhang, Lijun1, zhanglijun@suda.edu.cn, Wang, Ziou2, wziou@suda.edu.cn, Li, Youzhong1,3, lidaqiai@126.com, Mao, Lingfeng1, lingfengmao@suda.edu.cn |
| Source: | IETE Journal of Research; Jul2017, Vol. 63 Issue 4, p473-481, 9p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 03772063 |
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| DOI: | 10.1080/03772063.2017.1285259 |
