View in EDS HTML Full Text PDF Full Text

A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit.

Saved in:
Bibliographic Details
Title: A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit.
Authors: Zhang, Lijun1, zhanglijun@suda.edu.cn, Wang, Ziou2, wziou@suda.edu.cn, Li, Youzhong1,3, lidaqiai@126.com, Mao, Lingfeng1, lingfengmao@suda.edu.cn
Source: IETE Journal of Research; Jul2017, Vol. 63 Issue 4, p473-481, 9p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 123690769
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Zhang%2C+Lijun%22">Zhang, Lijun</searchLink><relatesTo>1</relatesTo>, <i>zhanglijun@suda.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Ziou%22">Wang, Ziou</searchLink><relatesTo>2</relatesTo>, <i>wziou@suda.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Li%2C+Youzhong%22">Li, Youzhong</searchLink><relatesTo>1,3</relatesTo>, <i>lidaqiai@126.com</i><br /><searchLink fieldCode="AU" term="%22Mao%2C+Lingfeng%22">Mao, Lingfeng</searchLink><relatesTo>1</relatesTo>, <i>lingfengmao@suda.edu.cn</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IETE+Journal+of+Research%22">IETE Journal of Research</searchLink>; Jul2017, Vol. 63 Issue 4, p473-481, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=123690769
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1080/03772063.2017.1285259
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 9
        StartPage: 473
    Titles:
      – TitleFull: A Precise Design for Testing High-Speed Embedded Memory using a BIST Circuit.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Zhang, Lijun
      – PersonEntity:
          Name:
            NameFull: Wang, Ziou
      – PersonEntity:
          Name:
            NameFull: Li, Youzhong
      – PersonEntity:
          Name:
            NameFull: Mao, Lingfeng
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: Jul2017
              Type: published
              Y: 2017
          Identifiers:
            – Type: issn-print
              Value: 03772063
          Numbering:
            – Type: volume
              Value: 63
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: IETE Journal of Research
              Type: main
ResultId 1