STUDY OF THE C[sub 2]H[sub 4]/Si(100)-(2×1) INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY.
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| Title: | STUDY OF THE C[sub 2]H[sub 4]/Si(100)-(2×1) INTERFACE BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY. |
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| Authors: | Xu, S. H.1, Wu, H. S.1, Tong, S. Y.2, Keeffe, M.3, Lapeyre, G. J.3, Rotenberg, E.4 |
| Source: | Surface Review & Letters; Dec2003, Vol. 10 Issue 6, p925-932, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0218625X |
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| DOI: | 10.1142/S0218625X03005670 |
